Date of Award
2014
Publisher
North Dakota State University
Document Type
Thesis
Degree Awarded
Master of Science (MS)
Program
Electrical and Computer Engineering
Department
Electrical and Computer Engineering
College
Engineering
Faculty Advisor
Lima, Ivan T., Jr.
Description
This work presents a new dynamic reliability management controller which successfully extends the expected lifetime of Chip Multi-Processors (CMPs). This is achieved by migrating tasks within the CMP, effectively reducing core wear and temperature. While this does decrease performance, results obtained show that the performance penalty is below 10% while lifetime expectancy increases are above 30%. The estimation of lifetime is done by using a full system simulator to obtain execution, power and temperature traces, and then feeding this data to the REliability eSTimation (REST) tool. REST uses a Monte Carlo based algorithm to estimate the Mean Time To Failure (MTTF) of the CMP according to aging mechanisms which affect the transistors.
Recommended Citation
Yamamoto, Alexandre Yasuo, "A New Method of Dynamic Reliability Management for Chip Multi-Processors" (2014). Electrical and Computer Engineering. 17.
https://digitalcommons.ndsu.edu/elec-comp-eng/17
Rights
NDSU Policy 190.6.2
Rights Link
https://www.ndsu.edu/fileadmin/policy/190.pdf
Handle Identifier
https://hdl.handle.net/10365/27286