Date of Award
2021
Publisher
North Dakota State University
Document Type
Thesis
Degree Awarded
Master of Science (MS)
Department
Industrial and Manufacturing Engineering
College
Engineering
Faculty Advisor
Yadav, Om
Description
The degradation of capacitors under accelerated stress conditions occurs in a monotonic and non-linear fashion. Several efforts have been made to model the degradation behavior of capacitor considering either physics-of-failure models or statistical models and subsequently estimate its reliability and lifetime parameters. But most of these models fail to reflect the physical properties of the degradation path, which varies according to several intrinsic and extrinsic factors. These factors introduce random and temporal uncertainty among the population of capacitors. The Gamma stochastic process can model both type of uncertainties among the population of capacitors. In this thesis, we model the capacitor degradation by non-homogeneous Gamma stochastic process in which both the model parameters (shape and scale) are dependent on stress variables. The model parameters are estimated using the maximum likelihood estimation approach. Two case studies have been presented and the life of capacitors has been estimated using Gamma process model.
Recommended Citation
Gupta, Anunay, "A Study of Degradation Modeling and Lifetime Estimation of Capacitors" (2021). Industrial and Manufacturing Engineering. 43.
https://digitalcommons.ndsu.edu/indust-manufac-engineering/43
Rights
NDSU policy 190.6.2
Rights Link
https://www.ndsu.edu/fileadmin/policy/190.pdf
Author ORCID Identifier
0000-0002-0275-7088
Handle Identifier
https://hdl.handle.net/10365/32654